Distributed test control architecture

Details Distributed test control architecture Distributed test control architecture

2006-08-22

2006-08-22

Lamarre, Guy (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S734000

Reexamination Certificate

active

07096398

ABSTRACT:
The invention includes an integrated circuit. The integrated circuit includes a test controller, at least one logic unit controller, and a test bus connected between the test controller and the logic unit controller. A design for test feature is connected to the logic unit controller. Moreover, a logic unit can be connected to the design for test feature.

REFERENCES:
patent: 5253255 (1993-10-01), Carbine
patent: 5764577 (1998-06-01), Johnston et al.
patent: 6181151 (2001-01-01), Wasson

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