Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-03-22
2011-03-22
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S032000
Reexamination Certificate
active
07913144
ABSTRACT:
Provided are a diagnostic device and the like providing a favorable diagnosis result by further improving the diagnosis resolution. A diagnostic device1has a symbol injection part3, which is composed of a symbol injection part for an active element5and a symbol injection part for a passive element7, an occurrence probability providing part9, an equal occurrence probability providing part11, and a switching part13. A per-test X-fault diagnosis flow by the diagnostic device1consists of a stage for collecting diagnostic information and a stage for drawing diagnostic conclusion. The layout of a deep-submicron LSI circuit usually needs to involve multiple layers, which means that vias are extensively used. Since via information is utilized by the symbol injection part for a passive element7, it becomes possible to locate defects to the via level, greatly improving the diagnostic resolution. Since, by the occurrence probability providing part9, a new diagnosis value is used and, the occurrence probabilities of possible faulty logic combinations are taken into consideration, the reality in a deep-submicron LSI circuit is better reflected, which contributes to the improvement of diagnostic resolution.
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Date Hiroshi
Kajihara Seiji
Minamoto Yoshihiro
Miyase Kohei
Wen Xiaoqing
Japan Science & Technology Agency
Kyushu Institute of Technology
Rankin , Hill & Clark LLP
System JD Co., Ltd.
Ton David
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