Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-02-20
2007-02-20
Ton, David (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S739000
Reexamination Certificate
active
10912006
ABSTRACT:
Devices and methods are provided for testing various types of smart cards including contact, contactless, and hybrid type (contact/contactless) smart cards. A test device includes a logic tester, a contactless interface unit, and a contact interface unit. The logic tester generates a test pattern that is transmitted to a smart card to test the smart card and compares a received response pattern with a response pattern to test a status of the smart card. The contactless interface unit enables a contactless test mode of operation and the contact interface unit enables a contact test mode of operation.
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Korean Patent Abstracts for Publication No. 1994-8435.
F. Chau & Associates LLC
Ton David
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