4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Ya-Chieh Lai

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Design check database

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Diagnosis of RAMS using functional patterns

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Fast pattern matching

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method and system for design rule checking enhanced with...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate

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Method and system for performing pattern classification of...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2658559

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