Debugging system for semiconductor integrated circuit

Details Debugging system for semiconductor integrated circuit Debugging system for semiconductor integrated circuit

2006-09-19

2006-09-19

Lamarre, Guy (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S039000, C714S045000

Reexamination Certificate

active

07111212

ABSTRACT:
A plurality of semiconductor integrated circuits have the same configuration as that of an LSI which is subjected to debugging. Different internal signals are respectively collected from the semiconductor integrated circuits under the same operation conditions. The operation of the LSI is analyzed based on the collected internal signals. By doing this, it is not necessary to add output terminals to the LSI or switch the internal signals output from output terminals at periodic time intervals. This facilitates the debugging of the entire LSI in a low-cost and simple configuration.

REFERENCES:
patent: 4710932 (1987-12-01), Hiroshi
patent: 5907671 (1999-05-01), Chen et al.
patent: 6205560 (2001-03-01), Hervin et al.
patent: 6523136 (2003-02-01), Higashida
patent: 6584590 (2003-06-01), Bean
patent: 6779145 (2004-08-01), Edwards et al.
patent: 1197322 (1985-11-01), None
patent: 0073602 (1983-03-01), None
patent: 02-077938 (1990-03-01), None
patent: 06-214819 (1994-08-01), None

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