4. Electricity: measuring and testing
  5. Electrostatic field
  6. Using modulation-type electrometer

James A. Slinkman

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Canary device for failure analysis

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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CMOS device having retrograde n-well and p-well

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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CMOS processing with low and high-current FETs

Fishing – trapping – and vermin destroying
Patent

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DC electric field assisted anneal

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into...
Reexamination Certificate

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DC or AC electric field assisted anneal

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1173902

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