Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-08-14
2007-08-14
Trinh, Michael (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S230000, C438S231000, C257SE21637
Reexamination Certificate
active
11122667
ABSTRACT:
An example method embodiment forms spacers that create tensile stress on the substrate on both the PFET and NFET regions. We form PFET and NFET gates and form tensile spacers on the PFET and NFET gates. We implant first ions into the tensile PFET spacers to form neutralized stress PFET spacers. The neutralized stress PFET spacers relieve the tensile stress created by the tensile stress spacers on the substrate. This improves device performance.
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Hsia Liang Choo
Koh Hui Peng
Lai Chung Woh
Lee Yong Meng
Lim Khee Yong
Chartered Semiconductor Manufacturing Ltd.
Trinh Michael
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