Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-01-30
2007-01-30
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S301000, C438S302000, C438S303000, C438S304000, C438S305000, C438S142000, C438S198000, C438S216000, C438S287000, C438S310000, C438S368000, C438S371000, C438S373000, C438S374000, C438S372000, C257SE21051
Reexamination Certificate
active
11066762
ABSTRACT:
A diffusion barrier (and method for forming the diffusion barrier) for a field-effect transistor having a channel region and a gate electrode, includes an insulating material being disposed over the channel region. The insulating material includes nitrogen (N), and is disposed under the gate electrode. The insulating material can be provided either as a layer or distributed within a gate dielectric material disposed under the gate electrode.
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Bojarczuk, Jr. Nestor Alexander
Chan Kevin Kok
D'Emic Christopher Peter
Gousev Evgeni
Guha Supratik
Ahmadi Mohsen
Kaufman, Esq. Stephen C.
Lebentritt Michael
McGinn IP Law Group PLLC
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