Complementary metal oxide semiconductor (CMOS) gate stack...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S301000, C438S302000, C438S303000, C438S304000, C438S305000, C438S142000, C438S198000, C438S216000, C438S287000, C438S310000, C438S368000, C438S371000, C438S373000, C438S374000, C438S372000, C257SE21051

Reexamination Certificate

active

11066762

ABSTRACT:
A diffusion barrier (and method for forming the diffusion barrier) for a field-effect transistor having a channel region and a gate electrode, includes an insulating material being disposed over the channel region. The insulating material includes nitrogen (N), and is disposed under the gate electrode. The insulating material can be provided either as a layer or distributed within a gate dielectric material disposed under the gate electrode.

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