4. Multiplex communications
  5. Wide area network
  6. Packet switching

Stephen K. Sunter

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Bist architecture for measurement of integrated circuit delays

Excavating
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Boundary scan with strobed pad driver enable

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Circuit and method for accurately applying a voltage to a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Circuit and method for adding parametric test capability to...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Circuit and method for detecting transient voltages on a dc...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Profile ID: LFUS-PAI-P-237362

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