4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Nitin Bhagwath

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Arrangement with conductive pad embedment

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Bypassing a device in a scan chain

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Multifunctional control of cooling systems for computers

Electrical computers and digital processing systems: support – Computer power control
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Profile ID: LFUS-PAI-P-3044953

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