4. Geometrical instruments
  5. Area integrators
  6. Electrical

William D. Hay

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Backscatter apparatus and method for measuring thickness of a co

Radiant energy – Inspection of solids or liquids by charged particles – Including a radioactive source
Patent

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Backscatter instrument having indexing feature for measuring coa

Radiant energy – Inspection of solids or liquids by charged particles – Including a radioactive source
Patent

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Probe guide and holder

Geometrical instruments – Area integrators – Electrical
Patent

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Profile ID: LFUS-PAI-P-1521323

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