Atomic layer deposition systems and methods including...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257SE21584, C438S653000, C438S656000

Reexamination Certificate

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07943507

ABSTRACT:
The present invention provides atomic layer deposition systems and methods that include at least one compound of the formula (Formula I): Ta(NR1)(NR2R3)3, wherein each R1, R2, and R3is independently hydrogen or an organic group, with the proviso that at least one of R1, R2, and R3is a silicon-containing organic group. Such systems and methods can be useful for depositing tantalum silicon nitride layers on substrates.

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