Atomic layer deposition method for depositing a layer

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S799000, C438S681000, C257SE21471, C257S576000, C427S255310

Reexamination Certificate

active

07579285

ABSTRACT:
The invention is related to an ALD method for depositing a layer including the steps of a) providing a semiconductor substrate in a reactor; b) providing a pulse of a first precursor gas into the reactor; c) providing a pulse of a second precursor gas into the reactor; d) providing an inert atmosphere in the reactor; and e) repeating step b) through step d), wherein at least once during step d) the semiconductor substrate is exposed to UV irradiation.

REFERENCES:
patent: 6395650 (2002-05-01), Callegari et al.
patent: 2002/0081826 (2002-06-01), Rotondaro et al.
patent: 2004/0266217 (2004-12-01), Kim et al.
patent: 2005/0074983 (2005-04-01), Shinriki et al.
patent: 2005/0087791 (2005-04-01), Park et al.
patent: 2005/0175789 (2005-08-01), Helms, Jr. et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Atomic layer deposition method for depositing a layer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Atomic layer deposition method for depositing a layer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Atomic layer deposition method for depositing a layer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4124574

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.