Analog/digital characteristics testing device and IC testing...

Details Analog/digital characteristics testing device and IC testing... Analog/digital characteristics testing device and IC testing...

2005-05-10

2005-05-10

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C324S765010

Reexamination Certificate

active

06892338

ABSTRACT:
An analog/digital characteristics testing device comprises: a plurality of measurement circuits for measuring an analog/digital characteristic of one or more ICs to be tested in accordance with a test condition data; and a setting unit for setting a different test condition data to each measurement circuit.

REFERENCES:
patent: 4216539 (1980-08-01), Raymond et al.
patent: 6331770 (2001-12-01), Sugamori
patent: 6378093 (2002-04-01), Whetsel
patent: 6449741 (2002-09-01), Organ et al.
patent: 6536006 (2003-03-01), Sugamori
patent: 6671844 (2003-12-01), Krech et al.
patent: 6690189 (2004-02-01), Mori et al.

Affiliated with

Also associated with

Rating

Analog/digital characteristics testing device and IC testing... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Analog/digital characteristics testing device and IC testing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analog/digital characteristics testing device and IC testing... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3400031