Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-10-30
2010-02-02
Vu, David (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257SE21618
Reexamination Certificate
active
07655523
ABSTRACT:
The present invention is a method for forming super steep doping profiles in MOS transistor structures. The method comprises forming a carbon containing layer (110) beneath the gate dielectric (50) and source and drain regions (80) of a MOS transistor. The carbon containing layer (110) will prevent the diffusion of dopants into the region (40) directly beneath the gate dielectric layer (50).
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Babcock Jeffrey A.
Balster Scott
Haeusler Alfred
Howard Gregory E.
Pinto Angelo
Brady III Wade J.
Garner Jacqueline J.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Vu David
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