Active hardmask for lithographic patterning

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S395000

Reexamination Certificate

active

07033739

ABSTRACT:
In an implementation, energy reaching the lower surface of a photoresist may be redirected back into the photoresist material. This may be done by, for example, reflecting and/or fluorescing the energy from a hardmask provided on the wafer surface back into the photoresist.

REFERENCES:
patent: 6830850 (2004-12-01), Krivokapic et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Active hardmask for lithographic patterning does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Active hardmask for lithographic patterning, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Active hardmask for lithographic patterning will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3563145

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.