4. Optics: measuring and testing
  5. By light interference
  6. For dimensional measurement
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Michelson Diagnostics Limited

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Microe Systems, Inc.

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Mikkelsen Hakon

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Miller Andre D.

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Miller Benjamin

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Milvich Michelle M

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Mitutoyo Corporation of Kamiyokoba

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Morath Christopher J.

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MTEX Matsumura Corporation

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Mueller Dieter E.

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Munteanu Florin

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Nakauchi Akihiro

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Namkoong Whan

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Nano Or Technologies Inc.

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Narumi Tatsuya

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Nasr Magued B.

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Natividad Phil S.

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Natividao Phi

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Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk

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Neily Richard A.

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