Technique and apparatus for two-phase systems analysis directly

Details Technique and apparatus for two-phase systems analysis directly Technique and apparatus for two-phase systems analysis directly

1982-07-12

1984-12-25

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 45, G01N 2322

Patent

active

044908326

ABSTRACT:
Method and apparatus for X-ray spectrum analysis of flowing material, and particularly where the material has two phases such as a suspension. A flow of gas or floats are used to separate the flowing material from an X-ray window in a casing containing an X-ray source and detector, which casing is located directly in the stream of flowing material. The gas flow provides a protective curtain across the window. An electrode structure is moveably mounted adjacent to the window and enables the solid state phase to be deposited for separate analysis of the solid and liquid phases of the flowing material.

REFERENCES:
patent: 3256431 (1966-06-01), Fraser

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