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Charge reduction in electrospray mass spectrometry

Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate

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Charge splitting resistive layer for a semiconductor gamma camer

Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent

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Charge transfer skimming and reset circuit

Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent

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Charged droplet spray probe

Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate

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Charged droplet sprayers

Radiant energy – Ionic separation or analysis – With sample supply means
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Charged droplet sprayers

Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate

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Charged particle beam apparatus

Radiant energy – Ionic separation or analysis – With sample supply means
Patent

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Charged particle beam detection system

Radiant energy – Ionic separation or analysis – Cyclically varying ion selecting field means
Reexamination Certificate

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Charged particle beam detection system

Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Reexamination Certificate

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Charged particle extraction arrangement

Radiant energy – Ionic separation or analysis – With sample supply means
Patent

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Charged particle mirror

Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means
Patent

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Charged particle mobility refrigerant analyzer

Radiant energy – Ionic separation or analysis – Methods
Patent

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Charged particle optical system for curved modulators

Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent

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Charged particle source with droplet control for mass...

Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate

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Charged particle trapping in near-surface potential wells

Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate

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Charged particle trapping in near-surface potential wells

Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate

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Charged-particle beam exposure system and method

Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent

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Charged-particle detectors and mass spectrometers employing the

Radiant energy – Ionic separation or analysis
Patent

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Charged-particle energy analyzer and mass spectrometer incorpora

Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent

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Charging of electrophotographic surfaces

Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent

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