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Targeted artifacts and methods for evaluating 3-D coordinate...

Optics: measuring and testing – Standard
Reexamination Certificate

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Test piece for optoelectronic image analysis systems

Optics: measuring and testing – Standard – Surface standard
Reexamination Certificate

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Test slide for microscopes and method for the production of...

Optics: measuring and testing – Standard
Reexamination Certificate

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Test system for optical disks

Optics: measuring and testing – Standard
Patent

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Test wafer for an optical scanner

Optics: measuring and testing – Standard
Patent

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Texture matching device

Optics: measuring and testing – Standard
Patent

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Thin film flying height calibration disk for calibrating flying

Optics: measuring and testing – Standard
Patent

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Two-beam gas analyzer and method for calibrating a two-beam gas

Optics: measuring and testing – Standard
Patent

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