Test piece for optoelectronic image analysis systems

Details Test piece for optoelectronic image analysis systems Test piece for optoelectronic image analysis systems

2007-10-23

2007-10-23

Nguyen, Sang H. (Department: 2886)

Optics: measuring and testing

Standard

Surface standard

C430S005000, C430S022000, C250S491100, C356S239800

Reexamination Certificate

active

10158092

ABSTRACT:
A test piece for an optoelectronic image analysis systems is disclosed. One embodiment has a planar substrate, on which a plurality of geometrical patterns of differing shapes and/or sizes are arranged in a durable, predetermined surface coverage. The geometrical patterns contrast optically against the substrate. The surface coverage of geometrical patterns on the substrate is provided such that an overlapping of the geometrical patterns is avoided. In addition, a method of fabrication of a test piece is provided, in which a metal film is deposited on a glass/ceramic substrate, subsequently the metal film is exposed according to a predetermined pattern, and finally the film is etched to create the geometrical pattern on the glass/ceramic substrate.

REFERENCES:
patent: 3907303 (1975-09-01), Locker
patent: 4591540 (1986-05-01), Bohlen et al.
patent: 4735881 (1988-04-01), Kobayashi et al.
patent: 4982214 (1991-01-01), Matsui
patent: 5012523 (1991-04-01), Kobayashi et al.
patent: 5308741 (1994-05-01), Kemp
patent: 5364718 (1994-11-01), Oae et al.
patent: 6124598 (2000-09-01), Takizawa
patent: 6335129 (2002-01-01), Asano et al.
patent: 6528334 (2003-03-01), Mizuo et al.
patent: 6628379 (2003-09-01), Sudo et al.
patent: 6668078 (2003-12-01), Bolle et al.
patent: 6912048 (2005-06-01), Pirani et al.
patent: 27 12 590 (1977-10-01), None
patent: 35 07 778 (1985-09-01), None
patent: 196 49 925 (1998-06-01), None
patent: 1 063 569 (2000-12-01), None

Affiliated with

Also associated with

Rating

Test piece for optoelectronic image analysis systems does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test piece for optoelectronic image analysis systems, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test piece for optoelectronic image analysis systems will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3875245