Targeted artifacts and methods for evaluating 3-D coordinate...

Details Targeted artifacts and methods for evaluating 3-D coordinate... Targeted artifacts and methods for evaluating 3-D coordinate...

2011-01-11

2011-01-11

Lauchman, L. G (Department: 2877)

Optics: measuring and testing

Standard

C356S601000, C356S620000, C356S625000, C702S152000

Reexamination Certificate

active

07869026

ABSTRACT:
A method for evaluating three-dimensional (3-D) coordinate system measurement accuracy of an optical 3-D measuring system using targeted artifacts is provided. In this regard, an exemplary embodiment of a method for evaluating 3-D coordinate system measurement accuracy using targeted artifacts comprises: taking a series of measurements from different positions and orientations using target dots on a targeted artifact with an optical 3-D measuring system; and calculating measurement errors using the series of measurements. An exemplary embodiment of a targeted artifact used with the method includes a base and target dots located on the base.

REFERENCES:
patent: 5540505 (1996-07-01), Struziak
patent: 5748505 (1998-05-01), Greer
patent: 5958847 (1999-09-01), Novak
patent: 6078846 (2000-06-01), Greer et al.
patent: 6165542 (2000-12-01), Jaworowski et al.
patent: 6175415 (2001-01-01), Pietrzak et al.
patent: 6205240 (2001-03-01), Pietrzak et al.
patent: 6285959 (2001-09-01), Greer
patent: 6704102 (2004-03-01), Roelke
patent: 6822748 (2004-11-01), Johnston et al.
patent: 6836323 (2004-12-01), Schmadel
patent: 6944564 (2005-09-01), De Jonge et al.
patent: 6977356 (2005-12-01), Vaidyanathan et al.
patent: 7036236 (2006-05-01), Drescher et al.
patent: 7084386 (2006-08-01), Bernardini et al.
patent: 7113878 (2006-09-01), Loferer et al.
patent: 7180607 (2007-02-01), Kyle et al.
patent: 2005/0068523 (2005-03-01), Wang et al.
patent: 2008/0243416 (2008-10-01), Bryll
patent: 2009/0033926 (2009-02-01), Haug

Affiliated with

Also associated with

Rating

Targeted artifacts and methods for evaluating 3-D coordinate... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Targeted artifacts and methods for evaluating 3-D coordinate..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Targeted artifacts and methods for evaluating 3-D coordinate... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2622531