4. Optics: measuring and testing
  5. Inspection of flaws or impurities
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Integrated circuit defect review and classification process

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Integrated emission microscope for panchromatic imaging, continu

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Integrated isotropic illumination source for translucent item in

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

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Integrated leak and vision inspection system

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

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Integrated soft bag inspection system

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Reexamination Certificate

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Interactive threshold tuning

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Interior inspection method and apparatus for enclosed spaces

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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Interior inspection method and apparatus for enclosed spaces

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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Interlayer dielectric void detection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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