Geometric surface inspection system with dual overlap light stri

Details Geometric surface inspection system with dual overlap light stri Geometric surface inspection system with dual overlap light stri

1986-08-18

1988-05-03

LaRoche, Eugene R.

Optics: measuring and testing

By polarized light examination

With light attenuation

356394, 356398, 356237, 358106, 358107, G01B 1124

Patent

active

047416211

ABSTRACT:
The present invention includes a surface inspection system with a single light source producing two light stripe sheets projected from different angles onto an inspected surface so that a combined light sheet produces a light stripe image with no shadows results. The two light stripe sheets are created by tangentially reflecting a laser beam off of separate cylindrical reflectors. The light stripe is detected by an imaging system, including a camera having a CCD image array, held at a fixed angle with respect to the light sheet which allows the two-dimensional curvature of the stripe to be detected. The two-dimensional light stripe image is converted into a digital image and processed by linear and logical digital filters that narrow the stripe down to two pixels wide. A coordinate extraction apparatus extracts the coordinates of the bottom row of the pixel image producing a digital representation of the light stripe curve. The sample curve is compared by a computer with a reference curve by obtaining the absolute value of the difference in height of points along the sample and reference curves after alignment and comparing the absolute value to an error or tolerance threshold. Any deviation beyond the fixed tolerance is reported as a surface irregularity defect.

REFERENCES:
patent: 4111557 (1978-09-01), Rottenkolber et al.
patent: 4498778 (1985-02-01), White
patent: 4652133 (1987-03-01), Antoszewski et al.
patent: 4683493 (1987-07-01), Taft et al.
patent: 4705401 (1987-11-01), Addleman

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