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Triple modulation experiment for a fourier transform spectromete

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Tube blockage monitor

Optics: measuring and testing – By particle light scattering
Reexamination Certificate

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Tunable wide angular aperture filter by degenerate four-wave mix

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Tuning of etalons

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Turbidimeter

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Turbidimeter

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Turbidity measurement

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Turbidity sensor

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Turbidity sensor

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Turbidity sensor with replaceable covers

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Turbidity sensor with the capability of regulating the intensity

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Twin-etalon scanning spectrometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Two dimensinal flow analyzer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Two-band Fourier transform spectrometer (FTS) with dichroic Mich

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Two-beam interferometer apparatus and method, and spectrometer u

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Two-beam interferometer for Fourier spectroscopy with rigid pend

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Two-frequency distance and displacement measuring interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Two-wavelength phase control system

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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