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Temperature control system for an element analyzer

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent

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Three mirror anastigmat spectrograph

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate

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Time-multiplexed scanning light source for multi-probe,...

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate

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Time-resolved fluorescence decay measurements for flowing partic

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent

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Torch for inductively coupled plasma spectrometry

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent

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Torch glassware for use with inductively coupled...

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate

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Trace element spectrometry with plasma source

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent

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Transient spectroscopic method and apparatus for in-process anal

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent

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Transport detector system

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent

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Two-photon microscope with spectral resolution

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate

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