Trace element spectrometry with plasma source

Details Trace element spectrometry with plasma source Trace element spectrometry with plasma source

1988-12-16

1990-02-20

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With sample excitation

21912136, 21912148, 250281, 250288, 31511121, G01N 2173

Patent

active

049020994

ABSTRACT:
A plasma trace element spectrometer comprises a microwave generator for generating microwave power, a microwave feeder for guiding and transforming the generated microwave power into microwave power of TE.sub.01 mode and supplying the microwave power of TE.sub.01 mode, a plasma producer having, at one end, an introduction port for a carrier gas and a sample and at the other end an opening and being cooperative with the supplied microwave power of TE.sub.01 mode to produce plasma of the carrier gas and sample introduced through the introduction port, and a spectrometer for analyzing constituent elements of the sample by measuring the produced plasma by way of the opening.

REFERENCES:
Beenakker et al, Spectrochimica Acta, vol. 33B, No. 7, 1978, pp. 373-381.
Estes et al, Analytical Chemistry, vol. 53, No. 9, Aug. 1981, pp. 1336-1340.
Goode et al, Applied Spectroscopy, vol. 38, No. 6, Nov./Dec. 1984, pp. 755-763.
Leis et al, Spectrochimica Acta, vol. 39B, No. 9-11, 1984, pp. 1459-1463.
Boumans et al, Philips Tech Review, vol. 33, No. 2, 1973, pp. 50-59.
Deutsch et al, Applied Spectroscopy, vol. 39, No. 2, 1985, pp. 214-222.
Abdallah et al, Spectrochimca Acta, vol. 37B, No. 7, 1982, pp. 583-592.
Zander et al, Analytical Chemistry, vol. 50, No. 9, Aug. 1978, pp. 1257-1260.

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