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Measurement of spectrometer background profile

Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Patent

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Method and apparatus for determining the zero line in atomic abs

Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Patent

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Method and arrangement for background compensation in material a

Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Patent

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Method and device for obtaining a low-noise optical signal

Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Reexamination Certificate

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Method and system for (trace) gas analysis

Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Patent

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Method for background corrected simultaneous multielement atomic

Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Patent

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Method of measuring atomic spectra compensating for atomic absor

Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Patent

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Method of obtaining high resolution light scattering spectra

Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Patent

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