Measurement of spectrometer background profile

Details Measurement of spectrometer background profile Measurement of spectrometer background profile

1999-08-26

2000-09-12

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With background radiation comparison

356326, G01J 302

Patent

active

061185299

ABSTRACT:
Background profiles for spectrometers are obtained by recording a number of background measurements over a period of time and analysing the measured data to create a statistical model of the instrument. The result is a set of stored background profiles with low noise level which are available when a sample measurement is made. The operator does not have to allow time to collect a background measurement as is the case in conventional techniques.

REFERENCES:
patent: 4827132 (1989-05-01), Moscovitch
patent: 5291426 (1994-03-01), Collins et al.

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