Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Patent
1988-11-04
1990-12-25
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
With background radiation comparison
356311, 356312, G01J 3433, G01N 2174
Patent
active
049798235
ABSTRACT:
In a background compensation in material analysis, the value of the background signal is separated from the value of a gross analyte signal generated by athermal radiation excitation after thermal excitation. The thermal atomization takes place in a stepwise manner by stepwise heating and each step is divided into a first part for the measurement of the gross analyte signal and a second part for the measurement of the background signal.
REFERENCES:
patent: 4318614 (1982-03-01), Falk et al.
patent: 4534646 (1985-08-01), Tamm et al.
Kerstan Felix
Mohr Joachim
Jenoptik Jena GmbH
McGraw Vincent P.
LandOfFree
Method and arrangement for background compensation in material a does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and arrangement for background compensation in material a, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and arrangement for background compensation in material a will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1159503