Method and arrangement for background compensation in material a

Details Method and arrangement for background compensation in material a Method and arrangement for background compensation in material a

1988-11-04

1990-12-25

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

With background radiation comparison

356311, 356312, G01J 3433, G01N 2174

Patent

active

049798235

ABSTRACT:
In a background compensation in material analysis, the value of the background signal is separated from the value of a gross analyte signal generated by athermal radiation excitation after thermal excitation. The thermal atomization takes place in a stepwise manner by stepwise heating and each step is divided into a first part for the measurement of the gross analyte signal and a second part for the measurement of the background signal.

REFERENCES:
patent: 4318614 (1982-03-01), Falk et al.
patent: 4534646 (1985-08-01), Tamm et al.

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