Method of obtaining high resolution light scattering spectra

Details Method of obtaining high resolution light scattering spectra Method of obtaining high resolution light scattering spectra

1979-05-04

1980-12-16

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With background radiation comparison

356301, 356326, G01J 344, G01J 330

Patent

active

042393906

ABSTRACT:
High resolution scattering spectra are obtained from irradiation of a sample with monochromatic light without disturbing the position of the sample, the spectra being characterized by freedom from artifacts due to the presence of optical components which distort the intensities of the scattered spectra. Scattered light from an irradiated sample and light from a white light source of constant or known emissivity are passed through the optical components and dispersed and measured with a monochromator and detector. The so-measured light intensities of the scattered light from the irradiated sample and the light from the white light source are ratioed at each wavelength to yield a light intensity representative solely of the scattered light from the irradiated sample, which is then displayed as a function of wavelength.

REFERENCES:
patent: 3874799 (1975-04-01), Isaacs et al.

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