LandOfFree - US Patents - Listing for Measuring and testing

Measuring and testing – Volume or rate of flow – By measuring vibrations or acoustic energy

Vortex shedding fluid flowmeter

Measuring and testing – Volume or rate of flow – By measuring vibrations or acoustic energy

Vortex shedding fluid velocity meter

Measuring and testing – Volume or rate of flow – By measuring vibrations or acoustic energy

Vortex shedding mass air flow sensor with stabilized fluid flow

Measuring and testing – Sampler – sample handling – etc. – Flow divider – deflector – or interceptor

Vortex suppression for an eductor

Measuring and testing – Volume or rate of flow – System

Vortex swirl flowmeter sensor circuit

Measuring and testing – Volume or rate of flow – System

Vortex-shedding flowmeter having a sensing vane

Measuring and testing – Volume or rate of flow – By measuring vibrations or acoustic energy

Vortex-shedding flowmeter having drag-actuated torsional sensor

Measuring and testing – Volume or rate of flow – By measuring vibrations or acoustic energy

Vortex-shedding flowmeter having two bluff bodies

Measuring and testing – Volume or rate of flow – By measuring vibrations or acoustic energy

Vortex-shedding flowmeter with torsional sensor mounted on torqu

Measuring and testing – Volume or rate of flow – By measuring vibrations or acoustic energy

Vortex-shedding flowmeter with unitary shedder/sensor

Measuring and testing – Volume or rate of flow – By measuring vibrations or acoustic energy

Vortex-shedding flowmeters

Measuring and testing – Meteorology – Electric disturbance

Vorticity probe utilizing strain measurements

Measuring and testing – Instrument proving or calibrating – Displacement – motion – distance – or position

Wafer alignment jig for wafer-handling systems

Measuring and testing – Vibration – Sensing apparatus

Wafer and method

Measuring and testing – Fluid pressure gauge – Electrical

Wafer bonded pressure sensor

Measuring and testing – Instrument proving or calibrating – Displacement – motion – distance – or position

Wafer center alignment device and method of wafer alignment

Measuring and testing – Instrument proving or calibrating – Displacement – motion – distance – or position

Wafer centering device and method of using

Measuring and testing – Testing of apparatus

Wafer inspection apparatus

Measuring and testing – Surface and cutting edge testing

Wafer level capped sensor