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Dual stage instrument for scanning a specimen

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Dual-purpose penetrant system

Measuring and testing – Surface and cutting edge testing
Patent

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Dynamic activation for an atomic force microscope and method...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Dynamic activation for an atomic force microscope and method...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Dynamic activation for an atomic force microscope and method...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Dynamic commutator profile system

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Dynamic quantity sensor and method for producing the same, disto

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Dynamic threshold margin to test memory storage media

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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