User interface for wafer data analysis and visualization

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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Details

C348S087000, C348S126000, C356S237100

Reexamination Certificate

active

07738693

ABSTRACT:
A wafer viewer system is provided for graphical presentation and analysis of a wafer and a wafer series. More specifically, the wafer viewer system includes a graphical user interface for displaying a wafer, graphically selecting regions of the wafer for analysis, performing analysis on the selected regions of the wafer, and displaying results of the analysis.

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