Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2003-05-30
2010-06-15
Carter, Aaron W (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C348S087000, C348S126000, C356S237100
Reexamination Certificate
active
07738693
ABSTRACT:
A wafer viewer system is provided for graphical presentation and analysis of a wafer and a wafer series. More specifically, the wafer viewer system includes a graphical user interface for displaying a wafer, graphically selecting regions of the wafer for analysis, performing analysis on the selected regions of the wafer, and displaying results of the analysis.
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Carter Aaron W
Lam Research Corporation
Martine & Penilla & Gencarella LLP
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