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Probe tip locator having improved marker arrangement for...

Geometrical instruments – Gauge – With support for gauged article
Reexamination Certificate

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Probe tracing method and means for coordinate measuring machine

Geometrical instruments – Area integrators – Electrical
Patent

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Probe triggering

Geometrical instruments – Gauge – Having a movable contact probe
Reexamination Certificate

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Probe type shape measuring sensor, and NC processing...

Geometrical instruments – Gauge – With support for gauged article
Reexamination Certificate

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Probe with stylus adjustment

Geometrical instruments – Area integrators – Electrical
Patent

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Probe with stylus pressure adjustment

Geometrical instruments – Area integrators – Electrical
Patent

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Probe with vibration damped stylus

Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate

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Probe, motion guiding device, position sensing apparatus, and po

Geometrical instruments – Gauge – With calibration device or gauge for nuclear reactor element
Patent

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Probe, motion guiding device, position sensing apparatus, and po

Geometrical instruments – Gauge – Pivoted probes
Patent

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Probepin-adjusting jig

Geometrical instruments – Miscellaneous – Light direction
Patent

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Prober for testing generator stator wedge tightness with rotor i

Geometrical instruments – Gauge – Collocating
Patent

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Prober with optical transmission scheme

Geometrical instruments – Gauge – Movable contact probe – per se
Patent

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Probes

Geometrical instruments – Gauge – Movable contact probe – per se
Patent

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Probes

Geometrical instruments – Gauge – Movable contact probe – per se
Patent

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Probes

Geometrical instruments – Area integrators – Electrical
Patent

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Probes

Geometrical instruments – Area integrators – Electrical
Patent

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Probing device for a coordinate measuring apparatus

Geometrical instruments – Distance measuring – Error compensation
Patent

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Probing device for a coordinate measuring apparatus

Geometrical instruments – Distance measuring – Error compensation
Patent

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Probing pin and probe system equipped therewith

Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate

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Procedure and sliding support for a profilometer

Geometrical instruments – Gauge – Work support
Patent

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