Probe tracing method and means for coordinate measuring machine

Details Probe tracing method and means for coordinate measuring machine Probe tracing method and means for coordinate measuring machine

1981-06-03

1983-09-27

Stearns, Richard R.

Geometrical instruments

Area integrators

Electrical

33174PC, G01B 703

Patent

active

044060688

ABSTRACT:
A probe tracing method and apparatus for a coordinate measuring machine including a trace control device in which the probe returns back along almost the same route as the proceeding contact stroke right after the contact with the object to be measured.

REFERENCES:
patent: 2835042 (1958-05-01), Tandler et al.
patent: 3226833 (1966-01-01), Lemelson
patent: 3571934 (1971-03-01), Buck, Sr.
patent: 3605909 (1971-09-01), Lemelson
patent: 3795054 (1974-03-01), Kinney
patent: 4118871 (1978-10-01), Kirkham

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