Geometrical instruments – Gauge – Having a movable contact probe
Reexamination Certificate
2005-09-13
2005-09-13
Fulton, Christopher W. (Department: 2859)
Geometrical instruments
Gauge
Having a movable contact probe
Reexamination Certificate
active
06941671
ABSTRACT:
A touch-trigger probe is described having a workpiece-contact sensor (15) in the form of a kinematic seating (10) and workpiece contacting stylus (12). A processor μP in the form of a reprogammable PIC microcontroller is used to monitor the signal from the sensor (15). When the signal is above a threshold for a continual period of time (CT) then the processor issues a trigger signal. The monitoring of the time period (Ct) may be delayed. This delay (Ci) allows triggering initiated by the shock wave produced initially when workpiece contact occurs.
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Fulton Christopher W.
Oliff & Berridg,e PLC
Renishaw PLC
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