Probing pin and probe system equipped therewith

Details Probing pin and probe system equipped therewith Probing pin and probe system equipped therewith

2007-06-19

2007-06-19

Guadalupe-McCall, Yaritza (Department: 2859)

Geometrical instruments

Gauge

Movable contact probe, per se

C033S556000, C033S503000

Reexamination Certificate

active

11432978

ABSTRACT:
A probing pin includes a predefined breaking point, which is arranged between a first section and a second section of the probing pin. The two sections each have a longitudinal axis. In the region of the predetermined breaking point, at least one of the longitudinal axes emerges from the outer contour of the probing pin at at least two axially offset points. A probe system may be equipped with such a probing pin.

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patent: 0 269 286 (1988-06-01), None

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