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Signal measuring apparatus and signal measuring method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Signal probe and probe assembly

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Signal probing of microwave integrated circuit internal nodes

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Signal processing circuit for electro-optic probe

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Signal sampling using flex circuits on direct inter-connects

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Signal sensor for rf integrated systems

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Signal sensor for rf integrated systems

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Signal supply apparatus and method for examining the same,...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Signal supply apparatus and method for examining the same,...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Signal test procedure for testing semi-conductor components...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Signal test procedure for testing semi-conductor components...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Signal transfer device for probe test fixture

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Signal-processing circuit arrangement for status signals of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Silicided silicon microtips for scanning probe microscopy

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Silicon wafer probe station using back-side imaging

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Silicon wafer testing rig and a method for testing a silicon waf

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Simple chip identification

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Simple inspection device for analyzer for ionic activity measurm

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of electrically operated apparatus
Patent

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Simple partial discharge detector for power equipment using...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Simplified contactless test of MCM thin film I/O nets using a pl

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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