Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Patent
1997-11-24
1999-10-05
Barlow, John
Data processing: measuring, calibrating, or testing
Testing system
Signal generation or waveform shaping
702118, 702119, 371 221, 39518303, G06F 11273, G01R 3128
Patent
active
059638893
DESCRIPTION:
BRIEF SUMMARY
BACKGROUND OF THE INVENTION
1. Field of the Invention
A method for computer-aided measurement and testing of electrical circuits using test software, and a test rig for carrying out such method, wherein the test software is split into a data-relevant element and a control-relevant element, the data-relevant element being formed in a text data field from which the control-relevant information can then be picked off.
2. Description of the Prior Art
Known computer-aided measurement and test procedures for electrical circuits, in particular for electrical assemblies, are carried out such that a dedicated software program must be written for each measurement and control task; such a software program contains both characteristic data, drivers and test routines, including evaluation requirements. The term test software in this case refers to that software which is required to control test equipment by means of computer-aided test rigs and for further processing of the measured data.
In most cases, programming is carried out on a product-oriented basis, that is to say the test program created can be used only for that particular unit. In addition, the structuring is directly dependent on the programmer. Only the originator can edit such programs. If the originator is no longer available, then the software must be recreated. Re-engineering is thus no longer possible. Consequently, known computer-controlled measurement and test procedures are also subject, in particular, to the following disadvantages: high production costs, very complex editing, no security of the know-how, and no program transparency.
The object of the present invention is to reduce the effort required for computer-aided measurement and test procedures for electrical circuits, in particular for electronic assemblies. Such object has particular relation to the production of software for carrying out measurement and control tasks using computer-aided measurement and test equipment.
SUMMARY OF THE INVENTION
This object is achieved in a method for computer-aided measurement and testing of electrical circuits using test software, and a test rig for carrying out the same, wherein the test software is split into a data-relevant element and a control-relevant element, the data-relevant element being formed in a text data field from which the control-relevant information can then be picked off. The splitting of the measurement and control tasks, into a data element and a test equipment driver element allows the effort for producing the software to be reduced by a factor of 3 to 10. By combining the data that are relevant to measurement tasks in a text data field, it is possible for anyone to carry out editing. This automatically results in a reengineering capability.
The test software can be designed to be product-independent. The output variables from the test specifications and the test instructions are kept transparent, that is to say these data are as legible as the basic document.
The text data field, which is located in the computer unit, expediently contains the test specification data, including stimuli and characteristic values, the test instruction data, including test step information and instructions, and a measurement data field accommodating test record data.
A test rig for carrying out the method according to the present invention is characterized by the use of a computer unit as a controller, a printer, a test equipment peripheral with the respectively required test equipment, for example a digital multimeter, and power supply units. Through the use of a test adapter for holding the electrical circuit, in particular the electronic assembly, in each case provided for testing it is possible for the power supply units to supply power to both the test adapter and the test equipment as there are connecting lines between the test equipment and the test adapter. The driver software is, in this case, used to control the test equipment available at the respective test rig. All the items of test equipment are connected to one another and to the c
REFERENCES:
"Providing Ada Based Test Program and Soft Panel Instrument Controls", by Dr. Jehuda Ziegler et al., ITT Avionics, NJ pp. 187-194.
Irregger Franz
Meissner Horst
Stephan Harald
Barlow John
Siemens Aktiengesellschaft
Vo Hien
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