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Apparatus and method for distance measurement with...

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
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Apparatus and method for distortion compensation

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
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Apparatus and method for dynamic configuration of...

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
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Apparatus and method for dynamic configuration of...

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
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Apparatus and method for dynamic smoothing

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
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Apparatus and method for enhancing accuracy of sensor signal

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
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Apparatus and method for event correlation and problem...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Apparatus and method for event correlation and problem...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Apparatus and method for event correlation and problem...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Apparatus and method for event correlation and problem...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Apparatus and method for filtering a digital signal

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
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Apparatus and method for generating a complementary...

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
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Apparatus and method for handheld sampling

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
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Apparatus and method for inline testing of electrical...

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
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Apparatus and method for inspecting patterns on wafers

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Apparatus and method for investigating parameters of layers...

Data processing: measuring – calibrating – or testing – Measurement system – Weight
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Apparatus and method for investigating semiconductors wafer

Data processing: measuring – calibrating – or testing – Measurement system – Weight
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Apparatus and method for locating devices using an acoustic...

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
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Apparatus and method for locating electronic job site plan...

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
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Apparatus and method for maintaining and controlling electronic

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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