Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2007-07-17
2007-07-17
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S104000
Reexamination Certificate
active
10826300
ABSTRACT:
An apparatus and method for enhancing the accuracy of a sensor signal are provided. The apparatus includes: a low-pass filter (LPF) that filters the sensor signal and outputs a low-frequency sensor signal; an operation determination unit that determines whether the sensor is not in operation; a bias estimating unit that estimates bias included in the low frequency sensor signal output from the LPF according to the output of the determination unit; and a subtractor that subtracts the estimated bias from the low frequency sensor signal according to the output of the operation determination unit.
REFERENCES:
patent: 4000369 (1976-12-01), Paul et al.
patent: 5825350 (1998-10-01), Case et al.
patent: 6546361 (2003-04-01), Di Tommaso et al.
Cho Seong-il
Koo Ji-hun
Lee Sang-goog
Bui Bryan
Sughrue & Mion, PLLC
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