Apparatus and method for dynamic configuration of...

Details Apparatus and method for dynamic configuration of... Apparatus and method for dynamic configuration of...

2007-01-23

2008-11-25

Nghiem, Michael P. (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

Reexamination Certificate

active

07457718

ABSTRACT:
A method of dynamically configuring a temperature profile in an integrated circuit (IC). The method includes sensing temperature of the IC, configuring a reduced operating temperature range for the IC, and modulating at least one control mechanism to maintain the temperature of the IC within the reduced operating temperature range. The configuring includes precluding configuration of the reduced operating temperature range at unauthorized privilege levels.

REFERENCES:
patent: 5544138 (1996-08-01), Bajorek et al.
patent: 5557557 (1996-09-01), Frantz et al.
patent: 5719800 (1998-02-01), Mittal et al.
patent: 5815724 (1998-09-01), Mates
patent: 5926641 (1999-07-01), Shay
patent: 5996083 (1999-11-01), Gupta et al.
patent: 6233691 (2001-05-01), Atkinson
patent: 6438697 (2002-08-01), Atkinson
patent: 2003/0158697 (2003-08-01), Gold et al.
patent: 2004/0204899 (2004-10-01), Gunther et al.
patent: 2006/0020838 (2006-01-01), Tschanz et al.
patent: 2006/0161373 (2006-07-01), Mangrulkar et al.
patent: 03273584.7 (2005-01-01), None

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