4. Data processing: measuring, calibrating, or testing
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Semiconductor process yield analysis based on evaluation of...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Semiconductor production system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
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Semiconductor production system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
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Semiconductor test apparatus

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
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Semiconductor testing method and semiconductor testing...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
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Semiconductor wafer inspection system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Semiconductor wafer inspection system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Semiconductor wafer inspection system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Sensing and estimating in-leakage air in a subambient...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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Sensing apparatus

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Sensing apparatus

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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Sensing apparatus

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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Sensing circuit

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Sensing downed power lines

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Sensing using polarization diversity and wavelength...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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Sensor apparatus for measuring volatile organic compounds

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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Sensor array for rapid materials characterization

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Biological or biochemical
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Sensor array-based system and method for rapid materials...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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Sensor device

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Sensor fusion system architecture

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
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