LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing,Calibration or correction system,Position measurement

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Defect review apparatus and method of reviewing defects

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Determination method for a position signal

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Device and method for automatic calibration of a...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Device and method for calibrating a robot

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Device and method for position measuring

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Patent

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Device for correcting reference position for transfer...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Difference correcting method for posture determining...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Digitizing system and rotary table for determining 3-D...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Digitizing system and rotary table for determining 3-D...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Display-device inspection apparatus and inspection method

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Distributed graph layout for sensor node networks

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Distributed graph layout for sensor node networks

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Dynamic artefact comparison

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Dynamic attitude measurement sensor and method

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Dynamic-mode atomic-force-microscope probe (Tip) vibration...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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