Methods and arrangements for introducing nitrogen into a tunnel

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438262, 438264, 438528, 438593, H01L 21336

Patent

active

059727519

ABSTRACT:
Methods and arrangements are provided for introducing nitrogen into a tunnel oxide layer within a stacked gate structure of a non-volatile memory cell. The nitrogen is advantageously introduced into only a select portion of the tunnel oxide, preferably nearer the source region of the memory cell. This prevents the unwanted or residual nitrogen from detrimentally affecting other devices within the semiconductor integrated circuit.

REFERENCES:
patent: 4683637 (1987-08-01), Varker et al.
patent: 5610084 (1997-03-01), Solo de Zaldivar
patent: 5759897 (1998-06-01), Kadosh et al.
patent: 5837585 (1998-11-01), Wu et al.
patent: 5861347 (1999-01-01), Maiti et al.

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