Method of forming lutetium and lanthanum dielectric structures

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S591000, C257SE21209

Reexamination Certificate

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08071443

ABSTRACT:
Methods of forming dielectric structures are shown. Methods of forming dielectric structures are shown that include lutetium oxide and lanthanum aluminum oxide crystals embedded within the lutetium oxide. Specific methods shown include monolayer deposition which yields process improvements such as chemistry control, step coverage, crystallinity/microstructure control.

REFERENCES:
patent: 5274249 (1993-12-01), Xi et al.
patent: 5840897 (1998-11-01), Kirlin et al.
patent: 5852306 (1998-12-01), Forbes
patent: 5923056 (1999-07-01), Lee et al.
patent: 5981350 (1999-11-01), Geusic et al.
patent: 6025225 (2000-02-01), Forbes et al.
patent: 6057271 (2000-05-01), Kenjiro et al.
patent: 6090636 (2000-07-01), Geusic et al.
patent: 6110529 (2000-08-01), Gardiner et al.
patent: 6134175 (2000-10-01), Forbes et al.
patent: 6150188 (2000-11-01), Geusic et al.
patent: 6191448 (2001-02-01), Forbes et al.
patent: 6198168 (2001-03-01), Geusic et al.
patent: 6203613 (2001-03-01), Gates et al.
patent: 6300193 (2001-10-01), Forbes
patent: 6317357 (2001-11-01), Forbes
patent: 6365470 (2002-04-01), Maeda
patent: 6380579 (2002-04-01), Nam et al.
patent: 6381168 (2002-04-01), Forbes
patent: 6399979 (2002-06-01), Noble et al.
patent: 6407424 (2002-06-01), Forbes
patent: 6418050 (2002-07-01), Forbes
patent: 6429065 (2002-08-01), Forbes
patent: 6432779 (2002-08-01), Hobbs et al.
patent: 6434041 (2002-08-01), Forbes et al.
patent: 6445023 (2002-09-01), Vaartstra et al.
patent: 6454912 (2002-09-01), Ahn et al.
patent: 6458701 (2002-10-01), Chae et al.
patent: 6465298 (2002-10-01), Forbes et al.
patent: 6476434 (2002-11-01), Noble et al.
patent: 6486027 (2002-11-01), Noble et al.
patent: 6486703 (2002-11-01), Noble et al.
patent: 6492233 (2002-12-01), Forbes et al.
patent: 6495436 (2002-12-01), Ahn et al.
patent: 6498065 (2002-12-01), Forbes et al.
patent: 6515510 (2003-02-01), Noble et al.
patent: 6518615 (2003-02-01), Geusic et al.
patent: 6526191 (2003-02-01), Geusic et al.
patent: 6538330 (2003-03-01), Forbes
patent: 6541280 (2003-04-01), Kaushik et al.
patent: 6574144 (2003-06-01), Forbes
patent: 6597037 (2003-07-01), Forbes et al.
patent: 6642573 (2003-11-01), Halliyal et al.
patent: 6689660 (2004-02-01), Noble et al.
patent: 6709978 (2004-03-01), Geusic et al.
patent: 6723577 (2004-04-01), Geusic et al.
patent: 6754108 (2004-06-01), Forbes
patent: 6764901 (2004-07-01), Noble et al.
patent: 6777715 (2004-08-01), Geusic et al.
patent: 6778441 (2004-08-01), Forbes et al.
patent: 6787370 (2004-09-01), Forbes
patent: 6804136 (2004-10-01), Forbes
patent: 6812513 (2004-11-01), Geusic et al.
patent: 6812516 (2004-11-01), Noble, Jr. et al.
patent: 6818937 (2004-11-01), Noble et al.
patent: 6858120 (2005-02-01), Ahn et al.
patent: 6858444 (2005-02-01), Ahn et al.
patent: 6888739 (2005-05-01), Forbes
patent: 6893984 (2005-05-01), Ahn et al.
patent: 6912158 (2005-06-01), Forbes
patent: 6914800 (2005-07-01), Ahn et al.
patent: 7045430 (2006-05-01), Ahn et al.
patent: 7217643 (2007-05-01), Liang
patent: 7494939 (2009-02-01), Ahn et al.
patent: 7531437 (2009-05-01), Brask et al.
patent: 7759237 (2010-07-01), Ahn et al.
patent: 2001/0009695 (2001-07-01), Saanila et al.
patent: 2002/0024080 (2002-02-01), Derderian et al.
patent: 2002/0025628 (2002-02-01), Derderian et al.
patent: 2002/0046705 (2002-04-01), Sandhu et al.
patent: 2002/0086507 (2002-07-01), Park et al.
patent: 2002/0089023 (2002-07-01), Yu et al.
patent: 2002/0100418 (2002-08-01), Sandhu et al.
patent: 2002/0102818 (2002-08-01), Sandhu et al.
patent: 2002/0110991 (2002-08-01), Li
patent: 2002/0146916 (2002-10-01), Irino et al.
patent: 2002/0164420 (2002-11-01), Derderian et al.
patent: 2002/0170671 (2002-11-01), Matsushita et al.
patent: 2002/0177244 (2002-11-01), Hsu et al.
patent: 2002/0192974 (2002-12-01), Ahn et al.
patent: 2002/0195056 (2002-12-01), Sandhu et al.
patent: 2003/0001241 (2003-01-01), Chakrabarti et al.
patent: 2003/0003722 (2003-01-01), Vaartstra
patent: 2003/0003730 (2003-01-01), Li
patent: 2003/0027360 (2003-02-01), Hsu et al.
patent: 2003/0032270 (2003-02-01), Snyder et al.
patent: 2003/0207540 (2003-11-01), Ahn et al.
patent: 2004/0164357 (2004-08-01), Ahn et al.
patent: 2004/0219783 (2004-11-01), Ahn et al.
patent: 2004/0233010 (2004-11-01), Akram et al.
patent: 2005/0023595 (2005-02-01), Forbes et al.
patent: 2005/0023602 (2005-02-01), Forbes et al.
patent: 2005/0023603 (2005-02-01), Eldridge et al.
patent: 2005/0024092 (2005-02-01), Forbes
patent: 2005/0026360 (2005-02-01), Geusic et al.
patent: 2005/0030825 (2005-02-01), Ahn
patent: 2005/0032342 (2005-02-01), Forbes et al.
patent: 2005/0164521 (2005-07-01), Ahn et al.
patent: 2005/0285225 (2005-12-01), Ahn et al.
patent: 2006/0046522 (2006-03-01), Ahn et al.
patent: 2007/0018214 (2007-01-01), Ahn
patent: 2007/0048926 (2007-03-01), Ahn
patent: 2007/0049051 (2007-03-01), Ahn et al.
patent: 2007/0099366 (2007-05-01), Ahn et al.
patent: 2007/0158702 (2007-07-01), Doczy et al.
patent: 2008/0185633 (2008-08-01), Choi et al.
patent: 1096042 (2001-05-01), None
patent: 1122795 (2001-08-01), None
patent: WO-0243115 (2002-05-01), None
patent: WO2009002560 (2008-12-01), None
Blauwe, J D, “Nanocrystal nonvolatile memory devices”, IEEE Trans. Nanotechnol., (2002), 72-77.
Bonera, E., et al., “Dielectric Properties of High-k Oxides : Theory and Experiment for Lu203”, Physical Review Letters, vol. 94, (2005), 027602-1 to 027602-4.
Booyong, S. L, et al., “Atomic Later deposition of lanthanum aluminum oxide nano-laminates for electrical applications”, Journal of Applied Physics, vol. 84(20), (2004), 3957-3959.
Copel, M., et al., “Formation of a stratified lanthanum silicate dielectric by reaction with Si(001)”, Applied Physics Letters, 78(11), (Mar. 12, 2001), 1607-1609.
Gougousi, Theodesia, et al., “The role of the OH species in high k polycrystalline silicon gate electrode interface reactions”, Applied Physics Letters, 80(23), (Jun. 2002), 4419-4421.
Guha, S, “Atomic beam deposition of lanthanum and yttrium based oxide thin films for gate dielectrics”, Applied Physics Letters, 77(17), (Oct. 23, 2000).
Gupta, J A, et al., “Gandolinium silicate gate dielectric films with Sub-1.5nm equivalent oxide thickness”, Applied Physics Letters, 78(12), (Mar. 2001), 1718-1720.
Hauser, J R, “Gate dielectrics for Sub-100nm CMOS”, Presented at 1999 IEDM Short Course on Sub 100 nm CMOS, (1999), 64 pgs.
Kim, Dong-Won, et al., “Memory characterization of SiGe quantum dot flash memories with HfO2and SiO2 tunneling dielectrics”, IEEE Transactions on Electron Devices, 50(9), (Sep. 2003), 1823-1829.
Kukli, Kaupo, et al., “Deposition of lanthanum sulfide thin films by atomic layer epitaxy”, Journal of Alloy and Compounds, 275-277, (1998), 10-14.
Kwon, Young Hae, et al., “Memory effects related to deep levels in metal-oxide semi-conductor structure with nanocrystalline Si”, Applied Physics Letters, 80(14), (Apr. 8, 2002), 2502-2504.
Marsella, Luca, et al., “Structure and stability of rare earth and transition metal oxides”, Physical Review B 69, (2004), 1272103-1 to 1272103-4.
Niemien, M., et al., “Surface-Controlled growth of LaA103thin films by atomic layer epitaxy”, Journal of Materials Chemistry, vol. 11, (2001), 2340-2345.
Nieminen, Minna, et al., “Formation and stability of lanthanum oxide thin films deposited from B-diketonate precursor”, Applied Surface Science, 174(2), (Apr. 16, 2001), 155-165.
Ohmi, S, et al., “Electrical characteristics for Lu2O3thin films fabricated by E beam depostion method”, Journal of the Electrochemical Society, 151(4), (2004), G279-G283.
Paivasaari, Jani, et al., “Synthesis, structure and properties of volatile lanthanide complexes containing amidinate ligands: application for Er2O3thin film growth by atomic layer deposition”, Journal of Materials Chemistry, (2005), 4224-4233.
Scarel, G, “Atomic layer deposition of Lu2O3”, Applied Physics Letters, 85(4

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