Wrapper leads gating TAP instruction and data registers

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S731000, C714S726000

Reexamination Certificate

active

08078927

ABSTRACT:
In a first embodiment a TAP318of IEEE standard 1149.1 is allowed to commandeer control from a WSP202of IEEE standard P1500 such that the P1500 architecture, normally controlled by the WSP, is rendered controllable by the TAP. In a second embodiment (1) the TAP and WSP based architectures are merged together such that the sharing of the previously described architectural elements are possible, and (2) the TAP and WSP test interfaces are merged into a single optimized test interface that is operable to perform all operations of each separate test interface.

REFERENCES:
patent: 7404129 (2008-07-01), Whetsel
patent: 7877658 (2011-01-01), Whetsel

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