Structure and process for the formation of TSVs

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S672000, C438S118000, C257S774000, C257SE23145

Reexamination Certificate

active

08034708

ABSTRACT:
An integrated circuit structure includes a semiconductor substrate; an interconnect structure over the semiconductor substrate, wherein the interconnect structure comprises a top inter-metal dielectric (IMD); an opening penetrating the interconnect structure into the semiconductor substrate; a conductor in the opening; and an isolation layer having a vertical portion and a horizontal portion physically connected to each other. The vertical portion is on sidewalls of the opening. The horizontal portion is directly over the interconnect structure. The integrated circuit structure is free from passivation layers vertically between the top IMD and the horizontal portion of the isolation layer.

REFERENCES:
patent: 6605528 (2003-08-01), Lin et al.
patent: 6642081 (2003-11-01), Patti
patent: 2005/0001327 (2005-01-01), Yamaguchi
patent: 2005/0202602 (2005-09-01), Asami et al.
patent: 2006/0249848 (2006-11-01), Coolbaugh et al.
patent: 2006/0278979 (2006-12-01), Rangel
patent: 2007/0045780 (2007-03-01), Akram et al.
patent: 2007/0132086 (2007-06-01), Agraharam et al.
patent: 2008/0006938 (2008-01-01), Patti et al.
patent: 10-335458 (1998-12-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Structure and process for the formation of TSVs does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Structure and process for the formation of TSVs, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structure and process for the formation of TSVs will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4263889

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.