Terminal pad structures and methods of fabricating same

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S613000, C438S618000, C257SE21508

Reexamination Certificate

active

07829452

ABSTRACT:
Terminal pads and methods of fabricating terminal pads. The methods including forming a conductive diffusion barrier under a conductive pad in or overlapped by a passivation layer comprised of multiple dielectric layers including diffusion barrier layers. The methods including forming the terminal pads subtractively or by a damascene process.

REFERENCES:
patent: 6033939 (2000-03-01), Agarwala et al.
patent: 6376353 (2002-04-01), Zhou et al.
patent: 6451681 (2002-09-01), Greer
patent: 6768199 (2004-07-01), Yoon et al.
patent: 6828677 (2004-12-01), Yap et al.
patent: 7122458 (2006-10-01), Cheng et al.
patent: 7122902 (2006-10-01), Hatano et al.
patent: 7397125 (2008-07-01), Oda
Notice of Allowance (Mail Date Oct. 17, 2008) for U.S. Appl. No. 11/953,927, filed Dec. 11, 2007; Confirmation No. 3059.
Notice of Allowance (Mail Date Nov. 29, 2007) for U.S. Appl. No. 10/908,346, filed May 9, 2005; Confirmation No. 5446; Patent No. 7,361,993 issued Apr. 22, 2008.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Terminal pad structures and methods of fabricating same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Terminal pad structures and methods of fabricating same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Terminal pad structures and methods of fabricating same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4252486

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.