Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2009-01-06
2010-11-09
Pham, Hoai v (Department: 2892)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S613000, C438S618000, C257SE21508
Reexamination Certificate
active
07829452
ABSTRACT:
Terminal pads and methods of fabricating terminal pads. The methods including forming a conductive diffusion barrier under a conductive pad in or overlapped by a passivation layer comprised of multiple dielectric layers including diffusion barrier layers. The methods including forming the terminal pads subtractively or by a damascene process.
REFERENCES:
patent: 6033939 (2000-03-01), Agarwala et al.
patent: 6376353 (2002-04-01), Zhou et al.
patent: 6451681 (2002-09-01), Greer
patent: 6768199 (2004-07-01), Yoon et al.
patent: 6828677 (2004-12-01), Yap et al.
patent: 7122458 (2006-10-01), Cheng et al.
patent: 7122902 (2006-10-01), Hatano et al.
patent: 7397125 (2008-07-01), Oda
Notice of Allowance (Mail Date Oct. 17, 2008) for U.S. Appl. No. 11/953,927, filed Dec. 11, 2007; Confirmation No. 3059.
Notice of Allowance (Mail Date Nov. 29, 2007) for U.S. Appl. No. 10/908,346, filed May 9, 2005; Confirmation No. 5446; Patent No. 7,361,993 issued Apr. 22, 2008.
Coolbaugh Douglas D.
Edelstein Daniel C.
Eshun Ebenezer E.
He Zhong-Xiang
Rassel Robert M.
International Business Machines - Corporation
Petrokaitis Joseph
Pham Hoai v
Schmeiser Olsen & Watts
LandOfFree
Terminal pad structures and methods of fabricating same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Terminal pad structures and methods of fabricating same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Terminal pad structures and methods of fabricating same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4252486